C. DUNN, J. How to fit models of recognition memory data using maximum likelihood. International Journal of Psychological Research, [S. l.], v. 3, n. 1, p. 140–149, 2010. DOI: 10.21500/20112084.859. Disponível em: https://revistas.usb.edu.co/index.php/IJPR/article/view/859. Acesso em: 28 apr. 2024.